Diffusion-based Clustering Analysis of Coherent X-ray Scattering Patterns of Self-assembled Nanoparticles
Citation
Huang, H.; Yoo, S.; Kaznatcheev, K.; Yager, K.G.; Lu, F.; Yu, D.; Gang, O. Fluerasu, A.; Qin, H. "Diffusion-based Clustering Analysis of Coherent X-ray Scattering Patterns of Self-assembled Nanoparticles
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Proceedings of the ACM Symposium on Applied Computing
2014,
29 85–90.
doi: 10.1145/2554850.2554914Summary
A new method for automated clustering of x-ray scattering data is presented.
Abstract
Coherent X-ray scattering is an emerging technique for measuring structure at the nanoscale. Data management and analysis is becoming a bottleneck in this technique. We present an unsupervised method which can sort and cluster the scattering snapshots, uncovering patterns inherent in the data. Our algorithm operates without resorting to templates, specific noise models, or user-directed learning. We test our methods using scattering images of two-dimensional nanoparticle assemblies. The experimental results show the effectiveness of our algorithm on real world scientific data.
